The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing.
Chung-Huang YehJwu E. ChenPublished in: ITC-Asia (2020)
Keyphrases
- test cases
- test generation
- test suite
- statistical tests
- test data
- code coverage
- software testing
- decision making
- regression testing
- test case generation
- integrated circuit
- set of test cases
- item response theory
- test data generation
- multiple choice
- statistical significance
- smart card
- decision rules
- database
- classification scheme
- test set
- null hypothesis
- decision makers
- information systems
- search engine
- authentication mechanism
- neural network