Chung-Huang Yeh

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 6

Top Topics

Statistical Significance

Set Of Test Cases

Test Case Generation

Top Venues

J. Electron. Test.

Publications

Chung-Huang Yeh, Jwu E. Chen
Multiple Retest Systems for Screening High-Quality Chips. J. Electron. Test. 39 (2) (2023)
Chung-Huang Yeh, Jwu E. Chen
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. IEEE Des. Test 40 (3) (2023)
Chung-Huang Yeh, Jwu E. Chen
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method. J. Circuits Syst. Comput. 32 (12) (2023)
Chung-Huang Yeh, Jwu E. Chen
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect. Sensors 22 (11) (2022)
Chung-Huang Yeh, Jwu E. Chen
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. ITC-Asia (2020)
Chung-Huang Yeh, Jwu E. Chen
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements. J. Electron. Test. 35 (4) (2019)