Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method.
Chung-Huang YehJwu E. ChenPublished in: J. Circuits Syst. Comput. (2023)
Keyphrases
- integrated circuit
- high accuracy
- prediction error
- detection method
- prediction accuracy
- objective function
- significant improvement
- cost function
- high precision
- segmentation method
- estimation accuracy
- similarity measure
- statistical significance
- test data
- synthetic data
- clustering method
- maximum likelihood
- least squares
- artificial neural networks
- pairwise
- preprocessing