On Bias in Transition Coverage of Test Sets for Path Delay Faults.

Irith Pomeranz Sudhakar M. Reddy

Published in: Asian Test Symposium (2010)

Keyphrases

test set
test cases
error rate
test suite
training set
test data
fault detection
training data
fault diagnosis
shortest path
model based diagnosis
evaluation methodology
path length
multicast tree
destination node
confidence intervals
image processing
optimal path
fault model
multiple paths