TOV: Sequential Test Generation by Ordering of Test Vectors.
Irith PomeranzSudhakar M. ReddyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
- test generation
- test cases
- test sequences
- symbolic execution
- code coverage
- software testing
- design automation
- mutation testing
- static analysis
- quality assurance
- regression testing
- test data generation
- feature vectors
- test suite
- data sets
- pattern matching
- data management
- image processing
- learning algorithm
- machine learning