Login / Signup
Efficient path delay test generation based on stuck-at test generation using checker circuitry.
Tsuyoshi Iwagaki
Satoshi Ohtake
Mineo Kaneko
Hideo Fujiwara
Published in:
ICCAD (2007)
Keyphrases
</>
test generation
test cases
symbolic execution
test sequences
design automation
static analysis
quality assurance
mutation testing
software testing
test data generation
code coverage
databases
image processing
case study
pattern matching