A Novel Multi-Classifier for Fault Diagnosis of Analog Circuit Based on the Unsupervised Binary tree and Support Vector Machines.
Anna WangJunfang LiuQinwan WangWenjing YuanPublished in: IMECS (2007)
Keyphrases
- fault diagnosis
- binary tree
- analog circuits
- support vector
- quadtree
- support vector machine
- neural network
- feature selection
- expert systems
- bp neural network
- fault detection
- fault detection and diagnosis
- fuzzy logic
- hierarchical structure
- digital circuits
- gas turbine
- multiple faults
- multi sensor information fusion
- training data
- kernel function
- electronic equipment
- operating conditions
- training set
- chemical process
- training samples
- radial basis function
- feature space
- data structure
- binary classification
- monitoring and fault diagnosis
- machine learning
- image compression
- multi class
- support vector regression
- image processing