Transparent Memory Testing for Pattern-Sensitive Faults.

Mark G. Karpovsky Vyacheslav N. Yarmolik

Published in: ITC (1994)

Keyphrases

test cases
fault model
associative memory
fault detection
pattern matching
fault diagnosis
memory usage
low memory
test data
memory requirements
limited memory
software testing
model based diagnosis
memory size
real time
pattern detection
data streams
social networks
fault detection and diagnosis
machine learning