Neural network-based inspection of solder joints using a circular illumination.
Jae-Hoon KimHyung Suck ChoPublished in: Image Vis. Comput. (1995)
Keyphrases
- neural network
- lighting conditions
- single image
- illumination conditions
- harmonic functions
- imaging conditions
- color constancy
- robust face recognition
- defect detection
- face recognition
- hough transform
- partial occlusion
- illumination variations
- visual inspection
- varying illumination
- pose variations
- illumination invariant
- pixel intensities
- automated visual inspection
- quality control
- automatic inspection