Reference-Free Machine Vision Inspection of semiconductor die Images.
Ada N. Y. NgEdmund Y. LamRonald ChungKenneth S. M. FungW. H. LeungPublished in: Int. J. Image Graph. (2009)
Keyphrases
- machine vision
- surface inspection
- quality control
- image data
- image processing
- automated visual inspection
- vision system
- visual inspection
- character recognition
- surface defects
- imaging systems
- image analysis
- image classification
- reference images
- ground truth
- image registration
- image retrieval
- image collections
- image annotation
- data mining
- three dimensional
- image database
- feature points
- test images
- input image
- region of interest
- image regions
- edge detection
- multiple images
- image features
- high resolution
- object recognition
- image set
- rigid body
- semiconductor manufacturing
- image matching
- computer vision
- real time