Defect-Oriented Fault Simulation and Test Generation in Digital Circuits.
Wieslaw KuzmiczWitold A. PleskaczJaan RaikRaimund UbarPublished in: ISQED (2001)
Keyphrases
- digital circuits
- test generation
- test cases
- circuit design
- design automation
- fault diagnosis
- model based diagnosis
- symbolic execution
- static analysis
- quality assurance
- functional decomposition
- test data generation
- code coverage
- cooperative
- decision diagrams
- test sequences
- software testing
- finite state machines
- multi agent systems