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Process Complexity and Cost Considerations of Multi-Layer Die Stacks.

Dimitrios VelenisJoeri De VosSoon-Wook KimJaber DerakhshandehPieter BexGiovanni CapuzSamuel SuhardKenneth June RebibisStefaan Van HuylenbroeckErik Jan MarinissenAlain PhommahaxayAndy MillerGerald BeyerGeert Van der PlasEric Beyne
Published in: 3DIC (2019)
Keyphrases
  • multi layer
  • genetic algorithm
  • object recognition
  • computer science
  • neural nets
  • feed forward neural networks
  • single layer
  • multiple layers
  • information retrieval
  • learning algorithm
  • linear combination