MULTIPLE LAYERS
Experts
- Jiro Hirokawa
- Lingyang Song
- Makoto Ando
- Víctor López
- Boya Di
- Majid Sarrafzadeh
- Jin-Tai Yan
- Dimitrios Klonidis
- Ioannis Tomkos
- Ramon Casellas
- Pengfei Wang
- Shlomo Shamai
- Kohei Shiomoto
- Zijie Zheng
- Chih-Hung Chang
- Alessio Giorgetti
- Jung-Chao Ban
- Filippo Cugini
- Mohit Chamania
- Ricardo Martínez
- Quanyan Zhu
- Raul Muñoz
- Alfred O. Hero III
- Luc Van Gool
- Osvaldo Simeone
- Brandon Oselio
- Piero Castoldi
- Francesco Paolucci
- Zhu Han
- Juan P. Fernández Palacios
- Ali Diba
- Chen Zhao
- Ronald I. Greenberg
- Domenico Siracusa
- Onur Sahin
- Manuel Sorge
- Shreyas Sundaram
- Thomas Szyrkowiec
- Andrea Sgambelluri
Venues
- CoRR
- IEEE Access
- Sensors
- OFC
- ICASSP
- GLOBECOM
- IJCNN
- ISCAS
- Microelectron. J.
- ICCAD
- J. Comput. Phys.
- Multim. Tools Appl.
- NeurIPS
- ICIP
- DAC
- Microelectron. Reliab.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Neurocomputing
- Expert Syst. Appl.
- RFC
- NEMS
- IEICE Trans. Commun.
- CVPR
- Appl. Math. Comput.
- Neural Networks
- ICTON
- IEICE Trans. Electron.
- Remote. Sens.
- Eng. Appl. Artif. Intell.
- Pattern Recognit.
- IEEE Trans. Neural Networks
- IEEE Trans. Geosci. Remote. Sens.
- ICC
- IROS
- Bioinform.
- Symmetry
- J. Vis.
- ICRA
- AAAI
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