On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests.

Nan-Cheng Lai Sying-Jyan Wang

Published in: ATS (2008)

Keyphrases

test generation
test cases
symbolic execution
test sequences
mutation testing
design automation
pattern matching
quality assurance
high speed
software testing
low cost
code coverage
static analysis
regression testing
analog vlsi
real world
high density
test data generation
artificial intelligence
machine learning