Nan-Cheng Lai

Publication Activity (10 Years)

Years Active: 2004-2013
Publications (10 Years): 0

Top Topics

Pattern Generator

Statistical Significance

Top Venues

J. Inf. Sci. Eng.

Publications

Nan-Cheng Lai, Sying-Jyan Wang
Delay Test with Embedded Test Pattern Generator. J. Inf. Sci. Eng. 29 (3) (2013)
Nan-Cheng Lai, Sying-Jyan Wang
On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests. ATS (2008)
Nan-Cheng Lai, Sying-Jyan Wang
Low-Capture-Power Test Generation by Specifying A Minimum Set of Controlling Inputs. ATS (2007)
Nan-Cheng Lai, Sying-Jyan Wang, Yu-Hsuan Fu
Low Power BIST with Smoother and Scan-Chain Reorder . Asian Test Symposium (2004)