Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.
Ioannis VoyiatzisDimitris GizopoulosAntonis M. PaschalisPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2005)
Keyphrases
- test generation
- test cases
- symbolic execution
- software testing
- test sequences
- design automation
- quality assurance
- static analysis
- code coverage
- signal processing
- mutation testing
- real time
- test data generation
- hough transform
- fault detection
- quality control
- integrity constraints
- software engineering
- regression testing
- object oriented
- video sequences
- high level
- image processing
- database