Simplifying Sequential Circuit Test Generation.

Meng-Lieh Sheu Chung-Len Lee

Published in: IEEE Des. Test Comput. (1994)

Keyphrases

test generation
test cases
test sequences
symbolic execution
high speed
design automation
static analysis
mutation testing
quality assurance
circuit design
high quality
regression testing
test data generation
artificial intelligence
software testing
database applications
error rate
machine learning
database