Meng-Lieh Sheu

Publication Activity (10 Years)

Years Active: 1994-2023
Publications (10 Years): 2

Top Topics

Successive Approximation

Vector Quantization

Moving Object Detection

Top Venues

Publications

Chi-An Tsai, Pei-Jun Lee, Trong-An Bui, Guo-Cheng Xu, Meng-Lieh Sheu
Moving Object Detection for Remote Sensing Video with Satellite Jitter. ICCE (2023)
Meng-Lieh Sheu, He-Jin Lee
CMOS Capacitive Fingerprint Sensing Scheme with Transition Band of Low Pass Filter. ICCE-TW (2021)
Meng-Lieh Sheu, Te-Hsiang Liu, Lin-Jie Tsao
A 22.4 fJ/conversion 0.7V 1.6μW 10-bit successive approximation ADC. VLSI-DAT (2014)
Meng-Lieh Sheu, Wei-Hung Hsu, Lin-Jie Tsao
A Capacitance-Ratio-Modulated Current Front-End Circuit With Pulsewidth Modulation Output for a Capacitive Sensor Interface. IEEE Trans. Instrum. Meas. 61 (2) (2012)
Meng-Lieh Sheu, Yu-Shang Tiao, Lin-Jie Taso
A 1-V 4-GHz wide tuning range voltage-controlled ring oscillator in 0.18 μm CMOS. Microelectron. J. 42 (6) (2011)
Meng-Lieh Sheu, Wei-Hung Hsu, Yuan-Chang Huang
Low Parasitic Capacitance and Low-Power CMOS Capacitive Fingerprint Sensor. J. Inf. Sci. Eng. 26 (2) (2010)
Meng-Lieh Sheu, Yu-Sheng Tiao, Hang-Yu Fan, Ji-Jin Huang
Implementation of a 2.45GHz Passive RFID Transponder Chip in 0.18um CMOS. J. Inf. Sci. Eng. 26 (2) (2010)
Chih-Wen Lu, Yen-Chih Shen, Meng-Lieh Sheu
A high-driving class-AB buffer amplifier with a new pseudo source follower. VLSI-SoC (2007)
Meng-Lieh Sheu, Ta-Wei Lin, Wei-Hung Hsu
Wide frequency range voltage controlled ring oscillators based on transmission gates. ISCAS (3) (2005)
Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih
Test Socket Chip for Measuring Dark Current in IR FPA. DELTA (2002)
Chung-Len Lee, Meng-Lieh Sheu
A Multiple-Sequence Generator Based on Inverted Nonlinear Autonomous Machines. IEEE Trans. Computers 45 (9) (1996)
Meng-Lieh Sheu, Chung-Len Lee
A programmable multiple-sequence generator for BIST applications. Asian Test Symposium (1995)
Meng-Lieh Sheu, Chung-Len Lee
Simplifying Sequential Circuit Test Generation. IEEE Des. Test Comput. 11 (3) (1994)