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Test Socket Chip for Measuring Dark Current in IR FPA.

Meng-Lieh SheuTai-Ping SunFar-Wen Jih
Published in: DELTA (2002)
Keyphrases
  • low cost
  • text retrieval
  • neural network
  • information retrieval
  • evolutionary algorithm
  • high speed
  • focal plane
  • analog vlsi
  • database
  • query expansion
  • test cases
  • image sensor