Small Test Set Generation with High Diagnosability.

Anupam Bhar Santanu Chattopadhyay Indranil Sengupta Rohit Kapur

Published in: J. Circuits Syst. Comput. (2016)

Keyphrases

test set
error rate
training set
training and test sets
training data
test data
test cases
evaluation methodology
training and test data
database
image sequences
object detection
fault diagnosis
class distribution
discrete event systems