Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis.
Chenglin YangShulin TianBing LongFang ChenPublished in: IEEE Trans. Instrum. Meas. (2011)
Keyphrases
- fault diagnosis
- analog circuits
- neural network
- expert systems
- soft computing methods
- fault detection
- power transformers
- rotating machinery
- multiple faults
- chemical process
- digital circuits
- bp neural network
- wavelet packet transform
- information fusion
- gas turbine
- failure diagnosis
- fuzzy logic
- multiresolution
- fault identification
- artificial neural networks
- electronic equipment
- machine learning