OCCURRENCE PROBABILITY
Experts
- Joseph Y. Halpern
- Jussi K. Vaurio
- Henry E. Kyburg Jr.
- Peter Grünwald
- Vladik Kreinovich
- Andrew Schumann
- Andris Ambainis
- Ji Hwan Cha
- Nir Drucker
- Linda C. van der Gaag
- Berthe M. P. Aleman
- Erik Quaeghebeur
- Andrew Lewis-Pye
- Paola Castellan
- Yixin Ye
- Franciszek Grabski
- Mani Sharifi
- Sahar Sadeghi
- Karol Rástocný
- Attila Csenki
- Arnolds Kikusts
- Helmut Fischer
- Venkatesan Guruswami
- Ali Maleki
- Judea Pearl
- Paolo Vicig
- George Barmpalias
- Jens Bennedsen
- Luca Sterpone
- Sébastien Destercke
- Stefan Wagner
- Atsunori Ogawa
- M. Ganjian
- Yuan Zhou
- Nicolas Sendrier
- Vidroha Debroy
- Maximilien Glorieux
- Kalle E. Jänkälä
- W. Eric Wong
Venues
- CoRR
- Reliab. Eng. Syst. Saf.
- Int. J. Approx. Reason.
- Eur. J. Oper. Res.
- Oper. Res.
- J. Appl. Probab.
- ISSRE
- IRPS
- J. Philos. Log.
- IEEE Access
- Entropy
- IEEE Trans. Reliab.
- Comput. Stat. Data Anal.
- UAI
- IEEE Trans. Inf. Theory
- IACR Cryptol. ePrint Arch.
- CogSci
- Theor. Comput. Sci.
- Int. J. Syst. Assur. Eng. Manag.
- CIMCA/IAWTIC
- ISIPTA
- IEEE Trans. Ind. Electron.
- TST
- Softw. Test. Verification Reliab.
- KR
- Electron. J. Comb.
- Commun. Stat. Simul. Comput.
- SAFECOMP
- Eng. Appl. Artif. Intell.
- J. Symb. Log.
- Sensors
- Ann. Oper. Res.
- Synth.
- Microelectron. Reliab.
- ECSQARU
- Appl. Math. Comput.
- IEEE Trans. Computers
- AAAI
- Inf. Sci.
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