OBJECT CATEGORY DETECTION
Experts
- Yoshinori Kobayashi
- Axel Pinz
- David A. Forsyth
- Andrew Zisserman
- Yoshinori Kuno
- Dipankar Das
- Barbara Caputo
- Alon Zweig
- Atabak Dehban
- Rui Figueiredo
- Shi Chen
- Mohammad Nayeem Teli
- Benjamin Johnston
- Mary-Anne Williams
- Jörn Anemüller
- Jinqiao Wang
- Hanqing Lu
- Rogan Mendoza
- Gao Zhu
- Mario Fritz
- Serge J. Belongie
- Bingquan Liu
- Tien-Lung Chang
- Himanshu Arora
- Alexander Stoytchev
- Derek Hoiem
- João Borrego
- Connor Schenck
- Danil V. Prokhorov
- Hongdong Li
- Jörg-Hendrik Bach
- J. B. Srivastava
- Seungwon Oh
- Jie Yang
- Ales Leonardis
- Plinio Moreno
- Atsuto Maki
- J. V. Vadavi
- Tao Mei
Venues
- CoRR
- CVPR
- ICPR
- Found. Trends Comput. Graph. Vis.
- ICEIS
- ICME
- Mach. Vis. Appl.
- Comput. Vis. Image Underst.
- PAKM
- MVA
- J. Electronic Imaging
- VISAPP
- ICVGIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- ICRA
- ICIP
- ISRR
- IEICE Trans. Inf. Syst.
- ICVS
- WACV
- Int. J. Robotics Res.
- Comput. Inf. Sci.
- IEEE Trans. Cogn. Dev. Syst.
- NIPS
- CIMCA/IAWTIC
- BMVC
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