NEGATIVELY AFFECT
Experts
- Jacopo Credi
- Marc J. Cawkwell
- Claudio Melchiorri
- Carlos José Pereira de Lucena
- Marvin Pafla
- Mallikarjuna Sastry Mallampalli
- Daniel Teichroew
- Shigeo Hirose
- Alexandr Tashlinskiy
- Jakab Molnar
- Markus Spanring
- Nikita A. Andriyanov
- Yingwei Luo
- Andreas Sesing-Wagenpfeil
- Jae-Hyeon Yeo
- Peng Dai
- Leonid M. Mitnik
- Peter Axel Nielsen
- K. C. Ho
- Bo Tang
- Stephan Schwarz
- Ukrist Srisamarn
- Thomas H. Bennett
- Katoo M. Muylle
- Macauley Kenney
- James Kennedy
- C. Siva Ram Murthy
- Isabel Fernandez Felipe
- Mojgan Ghare
- Christopher L. Moore
- Nicholas Lease
- José Pedro Pinto
- Virginia W. Manner
- Sepehr Farhand
- Hongyu Yu
- Frédéric Pattyn
- Gyu-Sik Kim
- Péter Tamás Zwierczyk
- Lapas Pradittasnee
Venues
- CoRR
- IEEE Access
- Scientometrics
- NBiS
- CHI
- Microelectron. Reliab.
- TURC
- BDET
- ATS
- ISS
- NordSec
- DATE
- WACV
- Inf. Softw. Technol.
- Kybernetes
- IGARSS (5)
- ECMS
- ACM SIGSOFT Softw. Eng. Notes
- PeerJ Comput. Sci.
- J. Chem. Inf. Model.
- CICARE
- I4CS
- Empir. Softw. Eng.
- HCI (17)
- ICS
- ICCS (6)
- MindCare
- WiOpt
- J. Inf. Knowl. Manag.
- Manag. Sci.
- ICSOB Companion
- Behav. Inf. Technol.
- TENCON
- IEEE Intell. Transp. Syst. Mag.
- AFRICON
- MoDELS (1)
- Scand. J. Inf. Syst.
- ICAART (1)
- SIGUCCS
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend