Andreas Gehring

Publication Activity (10 Years)

Years Active: 2002-2007
Publications (10 Years): 0

Publications

Markus Karner, Andreas Gehring, M. Wagner, Robert Entner, Stefan Holzer, Wolfgang Gös, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr
VSP - A gate stack analyzer. Microelectron. Reliab. 47 (4-5) (2007)
Markus Karner, Andreas Gehring, Stefan Holzer, Hans Kosina
Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling. LSSC (2005)
Andreas Gehring, Siegfried Selberherr
Statistical simulation of gate dielectric wearout, leakage, and breakdown. Microelectron. Reliab. 44 (9-11) (2004)
Tesfaye Ayalew, Andreas Gehring, Tibor Grasser, Siegfried Selberherr
Enhancement of breakdown voltage for Ni-SiC Schottky diodes utilizing field plate edge termination. Microelectron. Reliab. 44 (9-11) (2004)
Andreas Gehring, Francisco Jimenez-Molinos, Hans Kosina, A. Palma, F. Gámiz, Siegfried Selberherr
Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices. Microelectron. Reliab. 43 (9-11) (2003)
Tesfaye Ayalew, Andreas Gehring, Jong Mun Park, Tibor Grasser, Siegfried Selberherr
Improving SiC lateral DMOSFET reliability under high field stress. Microelectron. Reliab. 43 (9-11) (2003)
Andreas Gehring
Testing of IP Services & Applications in a Service Provider Environment. TestCom (2002)