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VSP - A gate stack analyzer.

Markus KarnerAndreas GehringM. WagnerRobert EntnerStefan HolzerWolfgang GösM. VasicekTibor GrasserHans KosinaSiegfried Selberherr
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • data acquisition
  • nano scale
  • computer vision
  • multiple input
  • low cost
  • hidden markov models