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Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices.
Andreas Gehring
Francisco Jimenez-Molinos
Hans Kosina
A. Palma
F. Gámiz
Siegfried Selberherr
Published in:
Microelectron. Reliab. (2003)
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computer vision
mobile devices
neural network
image processing
image segmentation