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Improving SiC lateral DMOSFET reliability under high field stress.
Tesfaye Ayalew
Andreas Gehring
Jong Mun Park
Tibor Grasser
Siegfried Selberherr
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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negatively affect
wide range
reliability analysis
database
real time
artificial intelligence
database systems
multiresolution
high precision
significantly higher
high levels
significantly lower
technological advances