C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Improving SiC lateral DMOSFET reliability under high field stress.
Tesfaye Ayalew
Andreas Gehring
Jong Mun Park
Tibor Grasser
Siegfried Selberherr
Published in:
Microelectron. Reliab. (2003)
Keyphrases
</>
negatively affect
wide range
reliability analysis
database
real time
artificial intelligence
database systems
multiresolution
high precision
significantly higher
high levels
significantly lower
technological advances