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Experts
- Nir A. Sochen
- Muralidhara Subbarao
- Lorina Dascal
- Kwun Yiu Cadmus To
- Rachid Deriche
- Stuart Anstee
- Robert Fitch
- Chaoli Wang
- Jun Ma
- Seiichi Nakamori
- Oliver J. Woodford
- Efstathios Bakolas
- Ron Kimmel
- Josefa Linares-Pérez
- Aurora Hermoso-Carazo
- Kyle A. Caudle
- Ajit Singh
- Lucero Lopez Perez
- Helder Araújo
- Naomi Yagi
- Congxuan Zhang
- Min Xu
- Xiao Wang
- Joachim Weickert
- Mark P. Balenzuela
- Sergey Tulyakov
- Mathias Pingault
- Karol Myszkowski
- Kamran Mohseni
- Jiawei Xu
- Kyung Chun Kim
- Fumin Zhang
- Lok Ming Lui
- S. G. Deshpande
- Takashi Tanaka
- Koichi Hirota
- Jean-Christophe Lapayre
- Hans-Peter Seidel
- Haocai Huang
Venues
- CoRR
- J. Vis.
- J. Comput. Phys.
- Sensors
- Comput. Math. Appl.
- ICIP
- IEEE Access
- Appl. Math. Comput.
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Comput. Graph. Forum
- IEEE Trans. Vis. Comput. Graph.
- CVPR
- IEEE Trans. Instrum. Meas.
- SIAM J. Math. Anal.
- IROS
- IEEE Visualization
- ICRA
- Medical Biol. Eng. Comput.
- IEEE Trans. Signal Process.
- IEEE Trans. Image Process.
- SIAM J. Appl. Math.
- Remote. Sens.
- Comput. Electron. Agric.
- Pattern Recognit. Lett.
- J. Appl. Math.
- J. Comput. Appl. Math.
- CDC/ECC
- ICPR
- Int. J. Comput. Vis.
- Comput. Geosci.
- Int. J. Model. Simul. Sci. Comput.
- IEEE Trans. Biomed. Eng.
- ACC
- WACV
- ICPR (1)
- J. Sci. Comput.
- Image Vis. Comput.
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