HARRIS CORNER DETECTOR
Experts
- John Impagliazzo
- Nicholas R. Gans
- Mohammad Awrangjeb
- Guojun Lu
- Muhammad Sarfraz
- Kaveh Fathian
- Gauthier Lafruit
- Clive S. Fraser
- H. Gary Knight
- Ruihao Li
- Greg E. Mellen
- J. Willard Curtis
- Jhing-Fa Wang
- Rudy Lauwereins
- Zar Nawab Khan Swati
- Shin-Dug Kim
- Elie Inaty
- Guoan Tang
- Juan-Pablo Ramirez-Paredes
- Nadia Kanwal
- Chiara Bartolozzi
- Svetha Venkatesh
- Angel Domingo Sappa
- Liyang Xiong
- Yih-Ming Su
- Pradip Mainali
- Ramesh C. Jain
- Aiko Dinale
- Vishal Monga
- James W. Cooper
- Gustavo Olague
- Benjamín Hernández
- Ishwar K. Sethi
- Leslie J. Kitchen
- Patrick J. Bonnin
- Yasser Alayli
- Kaiyue Li
- Yongjun Zhang
- Mangipudi Partha Sarathi
Venues
- CoRR
- Pattern Recognit. Lett.
- ICIP
- Cryptologia
- Inroads
- IGARSS
- Multim. Tools Appl.
- Sensors
- IEEE Access
- ICPR
- DICTA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Neurocomputing
- Remote. Sens.
- MVA
- ROBIO
- IEEE Robotics Autom. Mag.
- CGIV
- ICASSP
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Image Process.
- Edutainment
- EUSIPCO
- CVPR
- VCIP
- IEEE Commun. Mag.
- J. Syst. Softw.
- ICARCV
- IROS
- ACC
- Euro-Par Workshops
- Eur. J. Oper. Res.
- J. Multim. Inf. Syst.
- Int. J. Inf. Commun. Technol.
- J. Comput. Res. Dev.
- Visual Information Processing
- GRAPP (AS/IE)
- ICC
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