HARRIS CORNER DETECTOR
Experts
- John Impagliazzo
- Mohammad Awrangjeb
- Guojun Lu
- Nicholas R. Gans
- Kaveh Fathian
- Clive S. Fraser
- H. Gary Knight
- Muhammad Sarfraz
- Gauthier Lafruit
- Benjamín Hernández
- Luc Van Gool
- Svetha Venkatesh
- James W. Cooper
- Mangipudi Partha Sarathi
- Chung-Pyo Hong
- Jhing-Fa Wang
- Leslie J. Kitchen
- Liyang Xiong
- Ishwar K. Sethi
- Ruoxiang Li
- Qiong Yang
- Li Li
- Shin-Dug Kim
- Angel Domingo Sappa
- Nadia Kanwal
- Leandro de Souza Rosa
- Vishal Monga
- Fan Zhang
- Chiara Bartolozzi
- Cheong-Ghil Kim
- Gustavo Olague
- Brian L. Evans
- Zar Nawab Khan Swati
- Dae-Hwan Kim
- Yih-Ming Su
- Pradip Mainali
- Yongjun Zhang
- Aiko Dinale
- Ramesh C. Jain
Venues
- CoRR
- Pattern Recognit. Lett.
- ICIP
- IGARSS
- Cryptologia
- Multim. Tools Appl.
- Inroads
- Sensors
- DICTA
- IEEE Access
- ICPR
- MVA
- Neurocomputing
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Remote. Sens.
- IEEE Robotics Autom. Mag.
- ROBIO
- Edutainment
- ACC
- ICARCV
- VCIP
- CVPR
- IROS
- IEEE Trans. Image Process.
- ICASSP
- CGIV
- IEEE Trans. Circuits Syst. Video Technol.
- J. Syst. Softw.
- IEEE Commun. Mag.
- EUSIPCO
- Ann. GIS
- CIT
- Int. J. Shape Model.
- Int. J. Intell. Syst.
- ACSD
- WACV
- IEEE ICCI
- ITITS (2)
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