DEPTH ESTIMATES
Experts
- Stefano Mattoccia
- Fabio Tosi
- Matteo Poggi
- Shuwei Shao
- Weihai Chen
- Xingming Wu
- Yang Tang
- Chaoqiang Zhao
- Nicu Sebe
- Vitor Guizilini
- Dan Xu
- Zhengguo Li
- Zhongcai Pei
- Chang-Su Kim
- Elisa Ricci
- Sergiu Nedevschi
- Luc Van Gool
- Zhong Liu
- Wei-Chen Chiu
- Kwanghoon Sohn
- Ge Li
- Xinchen Ye
- Rares Ambrus
- Lina Liu
- Adrien Gaidon
- Thomas H. Li
- Dongbo Min
- Yong Liu
- Hemang Chawla
- Yi-Hsuan Tsai
- Elahe Arani
- Chunhua Shen
- Yi Xu
- Xin Fan
- Bahram Zonooz
- Pan Ji
- Janne Heikkilä
- Vaishakh Patil
- Filippo Aleotti
Venues
- CoRR
- CVPR
- ICRA
- ICCV
- IEEE Access
- ICIP
- IROS
- CVPR Workshops
- Sensors
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Circuits Syst. Video Technol.
- ICPR
- 3DV
- IEEE Trans. Pattern Anal. Mach. Intell.
- WACV
- IEEE Trans. Multim.
- IEEE Robotics Autom. Lett.
- Pattern Recognit.
- Multim. Tools Appl.
- ACM Multimedia
- Image Vis. Comput.
- ICCE
- Neurocomputing
- IEEE Trans. Consumer Electron.
- Pattern Recognit. Lett.
- ROBIO
- Eng. Appl. Artif. Intell.
- BMVC
- VCIP
- AAAI
- IEEE Trans. Intell. Transp. Syst.
- Vis. Comput.
- ECCV (1)
- Remote. Sens.
- IECON
- ITSC
- ICCV Workshops
- Comput. Vis. Image Underst.
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