DENSE DISPARITY MAP
Experts
- Oliver Wasenmüller
- Didier Stricker
- René Schuster
- Gauthier Lafruit
- Minglun Gong
- Zhibo Rao
- Richard Szeliski
- Ramy Battrawy
- Qiong Chang
- Gangwei Xu
- Ke Zhang
- Jiangbo Lu
- Tsutomu Maruyama
- Yuchao Dai
- Kwanghoon Sohn
- Christian Bailer
- Xin Yang
- Yee-Hong Yang
- Marc Pollefeys
- Jie Li
- Soohyun Kim
- Mohamed El Ansari
- Yong Zhao
- Kyung-Soo Kim
- Seungryong Kim
- Daniel Scharstein
- Masatoshi Okutomi
- Yi-Hsuan Tsai
- Wenbang Yang
- Sei-ichiro Kamata
- Liang Wang
- Chengxi Yang
- John A. Kalomiros
- Jieqing Feng
- Bifa Liang
- Menglong Yang
- Stefano Mattoccia
- Zhelun Shen
- Sean Ryan Fanello
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Circuits Syst. Video Technol.
- IROS
- IEEE Access
- IEEE Trans. Image Process.
- Image Vis. Comput.
- BMVC
- Signal Process. Image Commun.
- Sensors
- ICRA
- IET Image Process.
- Remote. Sens.
- J. Electronic Imaging
- Vis. Comput.
- IGARSS
- ICCV
- ICIP (3)
- Multim. Tools Appl.
- IET Comput. Vis.
- IEEE Robotics Autom. Lett.
- J. Real Time Image Process.
- J. Vis. Commun. Image Represent.
- WACV
- 3DV
- Pattern Recognit.
- SIU
- ITSC
- ICME
- ISCAS
- ISVC (1)
- ICASSP
- ACCV (1)
- Microprocess. Microsystems
- VCIP
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend