DENSE DISPARITY MAP
Experts
- Oliver Wasenmüller
- René Schuster
- Didier Stricker
- Gauthier Lafruit
- Minglun Gong
- Zhibo Rao
- Yuchao Dai
- Ramy Battrawy
- Richard Szeliski
- Tsutomu Maruyama
- Kwanghoon Sohn
- Gangwei Xu
- Jiangbo Lu
- Qiong Chang
- Ke Zhang
- Christian Bailer
- Mohamed El Ansari
- Marc Pollefeys
- Kyung-Soo Kim
- Soohyun Kim
- Jie Li
- Seungryong Kim
- Yee-Hong Yang
- Yong Zhao
- Xin Yang
- Daniel Scharstein
- Dongbo Min
- Heiko Hirschmüller
- Béatrice Pesquet-Popescu
- Haojie Li
- Stefano Mattoccia
- Liang Wang
- Jieqing Feng
- Ruigang Yang
- Yi-Hsuan Tsai
- Sean Ryan Fanello
- John A. Kalomiros
- Michael Bleyer
- Xuchong Zhang
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Access
- IEEE Trans. Image Process.
- IROS
- BMVC
- Signal Process. Image Commun.
- Image Vis. Comput.
- Sensors
- Remote. Sens.
- ICRA
- IET Image Process.
- ICCV
- IGARSS
- Multim. Tools Appl.
- ICIP (3)
- J. Electronic Imaging
- Vis. Comput.
- J. Real Time Image Process.
- Pattern Recognit.
- J. Vis. Commun. Image Represent.
- IET Comput. Vis.
- SIU
- IEEE Robotics Autom. Lett.
- 3DV
- WACV
- VCIP
- ISCAS
- ICME
- Microprocess. Microsystems
- ISVC (1)
- ICASSP
- ACCV (1)
- ITSC
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