DENSE DISPARITY MAP
Experts
- René Schuster
- Didier Stricker
- Oliver Wasenmüller
- Gauthier Lafruit
- Zhibo Rao
- Minglun Gong
- Gangwei Xu
- Qiong Chang
- Jiangbo Lu
- Kwanghoon Sohn
- Ramy Battrawy
- Richard Szeliski
- Ke Zhang
- Yuchao Dai
- Tsutomu Maruyama
- Jie Li
- Kyung-Soo Kim
- Xin Yang
- Mohamed El Ansari
- Soohyun Kim
- Seungryong Kim
- Daniel Scharstein
- Yee-Hong Yang
- Marc Pollefeys
- Christian Bailer
- Yong Zhao
- Sei-ichiro Kamata
- Sean Ryan Fanello
- Bifa Liang
- Masaki Onishi
- Dingfu Zhou
- Huei-Yung Lin
- Hong Jeong
- Wei-Chen Chiu
- Andrew J. Davison
- Aolong Zha
- Shahram Izadi
- Liang Wang
- Yi-Hsuan Tsai
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- IROS
- IEEE Trans. Image Process.
- IEEE Access
- Signal Process. Image Commun.
- Image Vis. Comput.
- BMVC
- Sensors
- Remote. Sens.
- ICRA
- IET Image Process.
- Multim. Tools Appl.
- Vis. Comput.
- ICCV
- IGARSS
- J. Electronic Imaging
- ICIP (3)
- 3DV
- J. Vis. Commun. Image Represent.
- Pattern Recognit.
- SIU
- IEEE Robotics Autom. Lett.
- J. Real Time Image Process.
- WACV
- IET Comput. Vis.
- ACCV (1)
- ISVC (1)
- ITSC
- ISCAS
- ICME
- Microprocess. Microsystems
- VCIP
- ICASSP
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