DENSE DISPARITY MAP
Experts
- Oliver Wasenmüller
- René Schuster
- Didier Stricker
- Gauthier Lafruit
- Zhibo Rao
- Minglun Gong
- Ke Zhang
- Gangwei Xu
- Qiong Chang
- Ramy Battrawy
- Yuchao Dai
- Tsutomu Maruyama
- Kwanghoon Sohn
- Jiangbo Lu
- Richard Szeliski
- Mohamed El Ansari
- Xin Yang
- Kyung-Soo Kim
- Yee-Hong Yang
- Daniel Scharstein
- Christian Bailer
- Marc Pollefeys
- Yong Zhao
- Jie Li
- Soohyun Kim
- Seungryong Kim
- Haojie Li
- Heiko Hirschmüller
- Aolong Zha
- Chengxi Yang
- Ruigang Yang
- Mingyi He
- Masaki Onishi
- Junda Cheng
- Stefano Mattoccia
- Béatrice Pesquet-Popescu
- Luc Van Gool
- Dingfu Zhou
- Hong Jeong
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Access
- IROS
- IEEE Trans. Image Process.
- BMVC
- Image Vis. Comput.
- Signal Process. Image Commun.
- Sensors
- IET Image Process.
- ICRA
- Remote. Sens.
- J. Electronic Imaging
- ICIP (3)
- ICCV
- IGARSS
- Vis. Comput.
- Multim. Tools Appl.
- J. Vis. Commun. Image Represent.
- SIU
- WACV
- Pattern Recognit.
- IET Comput. Vis.
- 3DV
- J. Real Time Image Process.
- IEEE Robotics Autom. Lett.
- ICASSP
- Microprocess. Microsystems
- ICME
- ISVC (1)
- ITSC
- ISCAS
- ACCV (1)
- VCIP
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