DENSE DISPARITY MAP
Experts
- René Schuster
- Oliver Wasenmüller
- Didier Stricker
- Gauthier Lafruit
- Zhibo Rao
- Minglun Gong
- Ramy Battrawy
- Kwanghoon Sohn
- Jiangbo Lu
- Qiong Chang
- Gangwei Xu
- Tsutomu Maruyama
- Ke Zhang
- Yuchao Dai
- Richard Szeliski
- Mohamed El Ansari
- Xin Yang
- Kyung-Soo Kim
- Jie Li
- Yong Zhao
- Christian Bailer
- Marc Pollefeys
- Yee-Hong Yang
- Daniel Scharstein
- Seungryong Kim
- Soohyun Kim
- Zhelun Shen
- Michael Bleyer
- Wenxiu Sun
- Heiko Hirschmüller
- Chengxi Yang
- Béatrice Pesquet-Popescu
- Shahram Izadi
- Liang Wang
- Yi-Hsuan Tsai
- Andrew J. Davison
- Aolong Zha
- Wei-Chen Chiu
- Masaki Onishi
Venues
- CoRR
- CVPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Access
- IEEE Trans. Image Process.
- IROS
- Sensors
- BMVC
- Image Vis. Comput.
- Signal Process. Image Commun.
- IET Image Process.
- ICRA
- Remote. Sens.
- ICIP (3)
- J. Electronic Imaging
- IGARSS
- ICCV
- Vis. Comput.
- Multim. Tools Appl.
- IET Comput. Vis.
- WACV
- J. Real Time Image Process.
- IEEE Robotics Autom. Lett.
- Pattern Recognit.
- SIU
- J. Vis. Commun. Image Represent.
- 3DV
- ICASSP
- VCIP
- Microprocess. Microsystems
- ICME
- ISCAS
- ITSC
- ISVC (1)
- ACCV (1)
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