DENSE DISPARITY MAP
Experts
- Oliver Wasenmüller
- Didier Stricker
- René Schuster
- Gauthier Lafruit
- Minglun Gong
- Zhibo Rao
- Qiong Chang
- Ke Zhang
- Kwanghoon Sohn
- Gangwei Xu
- Ramy Battrawy
- Richard Szeliski
- Yuchao Dai
- Jiangbo Lu
- Tsutomu Maruyama
- Xin Yang
- Seungryong Kim
- Daniel Scharstein
- Yong Zhao
- Kyung-Soo Kim
- Christian Bailer
- Yee-Hong Yang
- Jie Li
- Marc Pollefeys
- Mohamed El Ansari
- Soohyun Kim
- Aolong Zha
- Xibin Song
- Huei-Yung Lin
- John A. Kalomiros
- Jieqing Feng
- Hongbin Sun
- Zhelun Shen
- Yi-Hsuan Tsai
- Stefano Mattoccia
- Dingfu Zhou
- Luc Van Gool
- Wei-Chen Chiu
- Andrew J. Davison
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- IEEE Trans. Circuits Syst. Video Technol.
- IROS
- IEEE Access
- IEEE Trans. Image Process.
- BMVC
- Signal Process. Image Commun.
- Image Vis. Comput.
- Sensors
- Remote. Sens.
- IET Image Process.
- IGARSS
- ICRA
- ICIP (3)
- ICCV
- J. Electronic Imaging
- Multim. Tools Appl.
- J. Real Time Image Process.
- Pattern Recognit.
- IEEE Robotics Autom. Lett.
- Vis. Comput.
- IET Comput. Vis.
- J. Vis. Commun. Image Represent.
- SIU
- ICME
- Microprocess. Microsystems
- 3DV
- VCIP
- ICASSP
- ITSC
- ACCV (1)
- ISVC (1)
- SMC
- VISIGRAPP (5: VISAPP)
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