AUTHORS EXAMINE
Experts
- Thierry Marchant
- Subrata Nandi
- Tanmoy Chakraborty
- Denis Bouyssou
- Dinesh Pradhan
- Sheridan Brown
- Alma Swan
- Koichiro Mashiko
- Vijay K. Bhargava
- Feria Wirba Singeh
- Hubert Emptoz
- Andrea Mannocci
- Yuji Yamada
- Michel Sabourin
- Benhui Chen
- Peggy M. Irish
- Yeheskel Bar-Ness
- E. Auger
- Jung-Ho Kim
- Reima Suomi
- Fadoua Drira
- Mahmoud Khonji
- William Enck
- Abdullah Abrizah
- Günhan Dündar
- Xiao-Jun Ma
- Ahmed M. Nazif
- Keshra Sangwal
- Mahsa Nikzad
- Lutz Bornmann
- Beniamino Cappelletti-Montano
- Dror Mughaz
- Hiroyuki Morinaka
- Jinglu Hu
- José M. Soler
- John C. Huber
- Geoff Hannington
- Grant Wardell-Johnson
- Gérard Maral
Venues
- Scientometrics
- CoRR
- J. Informetrics
- IEEE Trans. Autom. Control.
- IEEE Trans. Commun.
- Inf. Syst. Res.
- IEEE Trans. Computers
- Patterns
- IEEE Trans. Fuzzy Syst.
- Autom.
- Learn. Publ.
- J. Assoc. Inf. Sci. Technol.
- CDC
- Online Inf. Rev.
- CHI
- Data Knowl. Eng.
- Data Sci. J.
- Hypertext
- Webology
- Electron. Libr.
- Intell. Tutoring Media
- PLoS Comput. Biol.
- ACM Trans. Knowl. Discov. Data
- Libr. Hi Tech
- FDG
- EISIC
- CLEF (Working Notes)
- Inf. Manag.
- Aslib J. Inf. Manag.
- ICSME
- Softw. Test. Verification Reliab.
- Publ.
- Inf. Sci.
- GLOBECOM
- W4A
- CHR
- J. Inf. Sci.
- J. Electron. Publ.
- TPDL
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