AUTHORS EXAMINE
Experts
- Thierry Marchant
- Alma Swan
- Tanmoy Chakraborty
- Dinesh Pradhan
- Subrata Nandi
- Denis Bouyssou
- Sheridan Brown
- Stéphane Bres
- Jane Huffman Hayes
- Stefano Montaldo
- Eisuke Nakazawa
- Catherine C. Marshall
- Takeshi Fukao
- Hiroyuki Morinaka
- S. Y. Kwon
- Sathvik Prasad
- Vincent Sarbach-Pulicani
- Pengfei Jia
- Isabel Belinchón
- Rand Alchokr
- Donald G. Whitehead
- Jeff Offutt
- William Enck
- Ikram Moalla
- Stasa Milojevic
- Véronique Eglin
- Vanessa Wirth
- Rafael Chaiken
- Koichiro Mashiko
- Keshra Sangwal
- Weimin Ge
- Reima Suomi
- Dong-Il Cho
- Han-Leih Liu
- Wei Wang
- Michael Tschuggnall
- Christophe Gravier
- Alain Blanchard
- Mohamed L. Seghier
Venues
- Scientometrics
- CoRR
- J. Informetrics
- IEEE Trans. Commun.
- IEEE Trans. Autom. Control.
- Learn. Publ.
- IEEE Trans. Fuzzy Syst.
- IEEE Trans. Computers
- J. Assoc. Inf. Sci. Technol.
- Autom.
- Online Inf. Rev.
- CDC
- Patterns
- IEEE Trans. Control. Syst. Technol.
- PLoS Comput. Biol.
- CLEF (Working Notes)
- Comput. Secur.
- J. Documentation
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Electron. Comput.
- J. Inf. Sci.
- Complex.
- ISSI
- ICIS
- First Monday
- Inf. Manag.
- TPDL
- J. Electron. Publ.
- SOUPS
- SSR
- Inf. Syst. Res.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Softw. Test. Verification Reliab.
- Sci. Eng. Ethics
- IEEE Trans. Pattern Anal. Mach. Intell.
- Data Knowl. Eng.
- CHI
- SAVE-SD@WWW
- Intell. Tutoring Media
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