Youbean Kim

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 1

Top Topics

Compressive Sensing

Original Signal

Top Venues

Publications

Jeonghyeon Choi, Youbean Kim
Low Loss Hybrid-Plane PCB Structure for Improving Signal Quality in High-Speed Signal Transmission. IEEE Access 12 (2024)
Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. IEICE Trans. Inf. Syst. (3) (2010)
Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Trans. Electron. (10) (2008)
Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Trans. Electron. (4) (2008)
Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Trans. Inf. Syst. (4) (2008)
Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang
A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Trans. Electron. (11) (2007)
Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. IET Comput. Digit. Tech. 1 (4) (2007)
Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. ATS (2006)
Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium (2005)