A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture.
Youbean KimMyung-Hoon YangYong LeeSungho KangPublished in: Asian Test Symposium (2005)
Keyphrases
- low power
- pattern generator
- vlsi architecture
- power consumption
- low cost
- high speed
- real time
- single chip
- ultra low power
- mixed signal
- vlsi circuits
- cmos technology
- high power
- low power consumption
- wireless transmission
- nm technology
- logic circuits
- built in self test
- data flow
- gate array
- signal processor
- design considerations
- integrated circuit
- cmos image sensor
- stereo matching
- video sequences