Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing.
Myung-Hoon YangYoubean KimYoungkyu ParkD. LeeSungho KangPublished in: IET Comput. Digit. Tech. (2007)
Keyphrases
- shift register
- low power
- high speed
- power consumption
- low power consumption
- single chip
- low cost
- high power
- wireless transmission
- logic circuits
- random number generator
- digital signal processing
- real time
- mixed signal
- hardware implementation
- vlsi circuits
- built in self test
- vlsi architecture
- cmos technology
- image sensor
- gate array