A New Analog-to-Digital Converter BIST Considering a Transient Zone.

Incheol Kim Kicheol Kim Youbean Kim HyeonUk Son Sungho Kang

Published in: IEICE Trans. Electron. (2007)

Keyphrases

analog to digital converter
delta sigma
noise shaping
image sensor
low power
mixed signal
built in self test
wavelet transform
low cost
cmos image sensor
image processing
high quality
high speed
frequency domain