​
Login / Signup
Kicheol Kim
ORCID
Publication Activity (10 Years)
Years Active: 2004-2022
Publications (10 Years): 2
Top Topics
Multiobjective Optimization
Solving Multi Objective Optimization Problems
Multi Objective Genetic Algorithms
Top Venues
APSEC
ASE
</>
Publications
</>
Misoo Kim
,
Youngkyoung Kim
,
Kicheol Kim
,
Eunseok Lee
Multi-objective Optimization-based Bug-fixing Template Mining for Automated Program Repair.
ASE
(2022)
Kicheol Kim
,
Misoo Kim
,
Eunseok Lee
Systematic Analysis of Defect-Specific Code Abstraction for Neural Program Repair.
APSEC
(2022)
Youbean Kim
,
Kicheol Kim
,
Incheol Kim
,
Sungho Kang
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.
IEICE Trans. Electron.
(10) (2008)
Kicheol Kim
,
Youbean Kim
,
Incheol Kim
,
HyeonUk Son
,
Sungho Kang
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.
IEICE Trans. Electron.
(4) (2008)
Youbean Kim
,
Kicheol Kim
,
Incheol Kim
,
Hyunwook Son
,
Sungho Kang
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST.
IEICE Trans. Inf. Syst.
(4) (2008)
Incheol Kim
,
Kicheol Kim
,
Youbean Kim
,
HyeonUk Son
,
Sungho Kang
A New Analog-to-Digital Converter BIST Considering a Transient Zone.
IEICE Trans. Electron.
(11) (2007)
Youbean Kim
,
Dongsup Song
,
Kicheol Kim
,
Incheol Kim
,
Sungho Kang
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure.
ATS
(2006)
Kicheol Kim
,
DongSub Song
,
Incheol Kim
,
Sungho Kang
A New Low Power Test Pattern Generator for BIST Architecture.
IEICE Trans. Electron.
(10) (2005)
Dongmyung Lee
,
Kwisung Yoo
,
Kicheol Kim
,
Gunhee Han
,
Sungho Kang
Code-width testing-based compact ADC BIST circuit.
IEEE Trans. Circuits Syst. II Express Briefs
(11) (2004)