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A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST.

Youbean KimKicheol KimIncheol KimHyunwook SonSungho Kang
Published in: IEICE Trans. Inf. Syst. (2008)
Keyphrases
  • pseudorandom
  • power reduction
  • random number
  • uniformly distributed
  • power consumption
  • secret key
  • random numbers
  • low power
  • power saving
  • high speed
  • built in self test
  • real time