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A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.
Youbean Kim
Kicheol Kim
Incheol Kim
Sungho Kang
Published in:
IEICE Trans. Electron. (2008)
Keyphrases
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phase locked
detection scheme
neural network
secret sharing scheme
data sets
decision trees
multiscale
digital libraries
integrated circuit
built in self test
phase locked loop