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A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.

Youbean KimKicheol KimIncheol KimSungho Kang
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • phase locked
  • detection scheme
  • neural network
  • secret sharing scheme
  • data sets
  • decision trees
  • multiscale
  • digital libraries
  • integrated circuit
  • built in self test
  • phase locked loop