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Code-width testing-based compact ADC BIST circuit.

Dongmyung LeeKwisung YooKicheol KimGunhee HanSungho Kang
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2004)
Keyphrases
  • binary codes
  • high speed
  • source code
  • concurrent programs
  • code generation
  • data flow
  • test generation
  • sigma delta
  • digital circuits
  • error correcting
  • low voltage
  • symbolic execution
  • test driven development