A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.

Kicheol Kim Youbean Kim Incheol Kim HyeonUk Son Sungho Kang

Published in: IEICE Trans. Electron. (2008)

Keyphrases

low cost
mixed signal
low power
circuit design
cmos image sensor
single chip
printed circuit
data conversion
delta sigma
gray level
camera phones
data acquisition
digital camera
real time
rfid tags
software testing
neural network
vlsi architecture
mean shift
test set
data sets