Yannick Rey-Tauriac

Publication Activity (10 Years)

Years Active: 2001-2007
Publications (10 Years): 0

Publications

D. Lachenal, Alain Bravaix, Frederic Monsieur, Yannick Rey-Tauriac
Degradation mechanism understanding of NLDEMOS SOI in RF applications. Microelectron. Reliab. 47 (9-11) (2007)
Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, Alain Bravaix
Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectron. Reliab. 45 (9-11) (2005)
Yannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud
Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 43 (9-11) (2003)
E. Carvou, F. Le Bihan, Anne Claire Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland
Reliability improvement of high value doped polysilicon-based resistors. Microelectron. Reliab. 42 (9-11) (2002)
Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud
Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. Microelectron. Reliab. 41 (9-10) (2001)
Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud
High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 41 (9-10) (2001)
Xavier Gagnard, Yannick Rey-Tauriac, Olivier Bonnaud
Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology. Microelectron. Reliab. 41 (9-10) (2001)