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Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology.

Xavier GagnardYannick Rey-TauriacOlivier Bonnaud
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • random access memory
  • design considerations
  • high speed
  • power consumption
  • low cost
  • cost effective
  • low voltage
  • database
  • real time
  • nearest neighbor
  • signal processing
  • computer systems
  • low power
  • cmos technology