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Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology.
Yannick Rey-Tauriac
J. Badoc
B. Reynard
R. A. Bianchi
D. Lachenal
Alain Bravaix
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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cmos technology
low power
spl times
power consumption
low voltage
parallel processing
low cost
power dissipation
high speed
image sensor
neural network
computer vision
pattern recognition
signal processing