Thomas Vervust

Publication Activity (10 Years)

Years Active: 2013-2021
Publications (10 Years): 5

Top Topics

Design Automation

Top Venues

Microelectron. Reliab.

J. Multimodal User Interfaces

IEEE Trans. Instrum. Meas.

Publications

Lousin Moumdjian, Thomas Vervust, Joren Six, Ivan Schepers, Micheline Lesaffre, Peter Feys, Marc Leman
The Augmented Movement Platform For Embodied Learning (AMPEL): development and reliability. J. Multimodal User Interfaces 15 (1) (2021)
Yang Yang, Bart Plovie, Gabriele Chiesura, Thomas Vervust, Lode Daelemans, Diana-Elena Mogosanu, Pieter Wuytens, Karen De Clerck, Jan Vanfleteren
Fully Integrated Flexible Dielectric Monitoring Sensor System for Real-Time In Situ Prediction of the Degree of Cure and Glass Transition Temperature of an Epoxy Resin. IEEE Trans. Instrum. Meas. 70 (2021)
Lousin Moumdjian, Thomas Vervust, Joren Six, Ivan Schepers, Micheline Lesaffre, Peter Feys, Marc Leman
Correction to: The Augmented Movement Platform For Embodied Learning (AMPEL): development and reliability. J. Multimodal User Interfaces 15 (1) (2021)
Bart Plovie, Jan Vanfleteren, Thomas Vervust, Andrés Vásquez Quintero, Frederick Bossuyt
Design Automation of Meandered Interconnects for Stretchable Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (9) (2019)
Yang Yang, Bart Plovie, Thomas Vervust, Jan Vanfleteren
Capacitive sensor network for composites production monitoring. IEEE SENSORS (2016)
Michal Jablonski, Riccardo Lucchini, Frederick Bossuyt, Thomas Vervust, Jan Vanfleteren, J. W. C. DeVries, Pasquale Vena, Mario Gonzalez
Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. Microelectron. Reliab. 55 (1) (2015)
Pieter Simoens, Elias De Coninck, Thomas Vervust, Jan-Frederik Van Wijmeersch, Tom Ingelbinck, Tim Verbelen, Maaike Op de Beeck, Bart Dhoedt
Vision: smart home control with head-mounted sensors for vision and brain activity. MCS@MobiSys (2014)
Michal Jablonski, Frederick Bossuyt, Jan Vanfleteren, Thomas Vervust, H. de Vries
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor. Microelectron. Reliab. 53 (7) (2013)