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Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability.

Michal JablonskiRiccardo LucchiniFrederick BossuytThomas VervustJan VanfleterenJ. W. C. DeVriesPasquale VenaMario Gonzalez
Published in: Microelectron. Reliab. (2015)
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