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H. de Vries
Publication Activity (10 Years)
Years Active: 2013-2013
Publications (10 Years): 0
Top Topics
Image Planes
Multiscale
Failure Rate
Software Reliability
Top Venues
Microelectron. Reliab.
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Publications
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Michal Jablonski
,
Frederick Bossuyt
,
Jan Vanfleteren
,
Thomas Vervust
,
H. de Vries
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor.
Microelectron. Reliab.
53 (7) (2013)