Sebastiano Russo

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 3

Top Topics

Numerical Methods

Integrated Circuit

Power Consumption

Top Venues

Microelectron. J.

Publications

Giovanni Corrente, Nella Bentivegna, Sebastiano Russo
Power Cycling Body Diode Current Flow on SiC MOSFET Device. IOLTS (2022)
Marco Santopá, Sebastiano Russo, Marco Torrisi, Marco Renna, Alessandro Sitta, Michele Calabretta
Fast transient thermomechanical stress to set a pressure-assisted sintering process. PRIME (2019)
Alessandro Sitta, Sebastiano Russo, Gaetano Bazzano, Daniela Cavallaro, Giuseppe Greco, Michele Calabretta
Numerical approach to predict power device reliability. DTIS (2018)
Nicola Petra, Sebastiano Russo, Davide De Caro, Ettore Napoli, Giancarlo Barbarino, Antonio G. M. Strollo
NORA based TDC in 90 nm CMOS. Microelectron. J. 44 (6) (2013)
Antonio Testa, Salvatore De Caro, Sebastiano Russo, D. Patti, Lucia Torrisi
High temperature long term stability of SiC Schottky diodes. Microelectron. Reliab. 51 (9-11) (2011)
Antonio Testa, Salvatore De Caro, Saverio Panarello, Salvatore Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor
Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectron. Reliab. 50 (9-11) (2010)
Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectron. Reliab. 45 (9-11) (2005)
Sebastiano Russo, Romeo Letor, Orazio Viscuso, Lucia Torrisi, Gianluigi Vitali
Fast thermal fatigue on top metal layer of power devices. Microelectron. Reliab. 42 (9-11) (2002)