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Reliability of planar, Super-Junction and trench low voltage power MOSFETs.
Antonio Testa
Salvatore De Caro
Saverio Panarello
Salvatore Patanè
Sebastiano Russo
D. Patti
S. Poma
Romeo Letor
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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low voltage
power management
power consumption
gallium arsenide
design considerations
power line
reactive power
cmos technology
energy efficiency
data center
low power
energy saving
energy consumption
computer vision
cost effective